EFFECT OF PRESSURE ON THE ELECTRICAL-RESISTANCE OF EUO

被引：37
|
作者：
DIMARZIO, D [1 ]
CROFT, M [1 ]
SAKAI, N [1 ]
SHAFER, MW [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
PHYSICAL REVIEW B | 1987年 / 35卷 / 16期
关键词：
D O I：
10.1103/PhysRevB.35.8891
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：8891 / 8893
页数：3
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