EFFECT OF PRESSURE ON THE ELECTRICAL-RESISTANCE OF EUO

被引：37

|

作者：

DIMARZIO, D ^{[1
]}

CROFT, M ^{[1
]}

SAKAI, N ^{[1
]}

SHAFER, MW ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICAL REVIEW B | 1987年 / 35卷 / 16期

关键词：

D O I：

10.1103/PhysRevB.35.8891

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：8891 / 8893

页数：3

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