MONITORING THE DEPTH OF THE DAMAGED SURFACE-LAYER OF SINGLE-CRYSTAL FERRITE

被引：0

作者：

MASLOV, VP

MELNIK, TS

SHULMAN, MG

机构：

来源：

JOURNAL OF OPTICAL TECHNOLOGY | 1994年 / 61卷 / 06期

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D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

This paper discusses a method for estimating the depth of the damaged layer, based on a comparison of the characteristics obtained by various independent test methods: Auger spectroscopy, x-ray diffraction reflection, ellipsometry, and electron microscopy. The ellipsometric test method is recommended as the main way to estimate the depth of the damaged layer of single-crystal ferrite by comparing the described calculation of the polarization angle of the test sample and a standard.

引用

页码：427 / 429

页数：3

共 50 条

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