DETERMINATION OF THIN OXIDE FILM THICKNESS BY INTEGRATED INTENSITY MEASUREMENTS

被引：11
|
作者：
BORIE, B
SPARKS, CJ
机构：
来源：
ACTA CRYSTALLOGRAPHICA | 1961年 / 14卷 / 06期
关键词：
D O I：
10.1107/S0365110X61001832
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：569 / &
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