共 50 条
- [2] A HIGH-PRECISION ADAPTATION OF THE TURNING POINT METHOD OF MONITORING THE OPTICAL-THICKNESS OF DIELECTRIC LAYERS USING MICROPROCESSORS OPTICA ACTA, 1982, 29 (02): : 221 - 234
- [3] PRECISION IN THE ELLIPSOMETRIC DETERMINATION OF THE OPTICAL-CONSTANTS OF VERY THIN-FILMS APPLIED OPTICS, 1982, 21 (16): : 2968 - 2971
- [5] AUTOMATIC-DETERMINATION OF THE OPTICAL-CONSTANTS OF INHOMOGENEOUS THIN-FILMS APPLIED OPTICS, 1982, 21 (22): : 4020 - 4029
- [6] AUTOMATIC EVALUATION OF OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS - APPLICATION TO THIN DIELECTRIC LAYERS NOUVELLE REVUE D OPTIQUE, 1976, 7 (06): : 353 - 362
- [8] DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF THIN-FILMS ON SLIGHTLY ABSORBING SUBSTRATES APPLIED OPTICS, 1995, 34 (34): : 7914 - 7924
- [9] High-precision determination of lattice constants and structural characterization of InN thin films JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2006, 24 (02): : 275 - 279
- [10] DETERMINATION OF SPATIAL DISTRIBUTIONS OF THICKNESS AND OPTICAL-CONSTANTS OF THIN-FILMS BY A NEW OPTICAL TECHNIQUE APPLIED OPTICS, 1981, 20 (21): : 3719 - 3722