AUTOMATIC HIGH-PRECISION DETERMINATION OF THE OPTICAL-THICKNESS OF THIN-FILMS

被引：0

|

作者：

SMITHLINE, LM ^{[1
]}

WOLGA, GJ ^{[1
]}

机构：

[1] LANSING RES CORP,ITHACA,NY 14850

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1979年 / 69卷 / 10期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：1434 / 1434

页数：1

相关论文

共 50 条

[41] MONITORING THE ARBITRARY THICKNESS OF OPTICAL THIN-FILMS AND THEIR ERROR SIMULATION - A METHOD
ZHU, Z
LI, WS
HUA, YS
APPLIED OPTICS, 1985, 24 (11): : 1693 - 1695
[42] THICKNESS TRANSITIONS IN THIN-FILMS - THE EQUILIBRIUM
KASHCHIEV, D
SURFACE SCIENCE, 1989, 220 (2-3) : 428 - 442
[43] THICKNESS DEPENDENCE OF CATHODOLUMINESCENCE IN THIN-FILMS
YUAN, J
BERGER, SD
BROWN, LM
JOURNAL OF PHYSICS-CONDENSED MATTER, 1989, 1 (20) : 3253 - 3265
[44] THICKNESS DEPENDENCE OF CATHODOLUMINESCENCE IN THIN-FILMS
YUAN, J
BERGER, S
BROWN, LM
REVUE DE PHYSIQUE APPLIQUEE, 1989, 24 (06): : 177 - 177
[45] HIGH-PRECISION SEMIMICRO AUTOMATIC TITRATOR
WISE, EN
ANALYTICAL CHEMISTRY, 1951, 23 (10) : 1479 - 1484
[46] A NEW METHOD FOR THE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILMS
STICHAUER, L
GAVOILLE, G
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1992, 133 (02): : 547 - 553
[47] DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILMS BY MEASUREMENTS OF INTENSITIES
HACMAN, D
KEUTSCHEGGER, A
OPTIK, 1973, 37 (04): : 391 - 403
[48] A COMPARISON OF METHODS FOR THE DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILMS
DELPOZO, JM
DIAZ, L
THIN SOLID FILMS, 1992, 209 (01) : 137 - 144
[49] OPTICAL-CONSTANT DETERMINATION OF THIN-FILMS - AN ANALYTICAL SOLUTION
SPINK, DM
THOMAS, CB
APPLIED OPTICS, 1988, 27 (21): : 4362 - 4362
[50] NEW METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILMS
WU, MH
FARHAT, NH
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (10) : 1195 - 1195

← 1 2 3 4 5 →