A REGRESSION METHOD FOR DETERMINING EPITAXIAL FILM THICKNESS

被引:0
|
作者
GRIGOREV, VK
PETROVSKII, VI
FEDUNINA, TA
机构
来源
MEASUREMENT TECHNIQUES USSR | 1981年 / 24卷 / 12期
关键词
D O I
10.1007/BF00828708
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1042 / 1045
页数:4
相关论文
共 50 条
  • [1] ERRORS IN MEASURING THE THICKNESS OF AN EPITAXIAL FILM BY THE CALCULATED INTERFEROGRAM METHOD
    LEZHNEV, VV
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1988, 55 (11): : 647 - 649
  • [2] A method for determining ultrathin DLC film thickness by spectroscopic ellipsometry
    J. M. Zhao
    P. Yang
    Microsystem Technologies, 2012, 18 : 1455 - 1461
  • [3] Film thickness determining method of the silicon isotope superlattices by SIMS
    Takano, Akio
    Shimizu, Yasuo
    Itoh, Kohei M.
    APPLIED SURFACE SCIENCE, 2008, 255 (04) : 1430 - 1432
  • [4] A method for determining ultrathin DLC film thickness by spectroscopic ellipsometry
    Zhao, J. M.
    Yang, P.
    MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2012, 18 (9-10): : 1455 - 1461
  • [5] CRITERIA FOR DETERMINING FILM THICKNESS
    BOGUSLAVSKII, MG
    LAANEOT, RA
    MEASUREMENT TECHNIQUES, 1972, 15 (06) : 870 - 872
  • [7] Method of Determining the Minimum Thickness of the Oil Film in Sliding Bearings.
    Wisniewski, Teofil
    Iskra, Antoni
    Przeglad Mechaniczny, 1979, 38 (04): : 5 - 9
  • [8] DETERMINATION OF THE FILM THICKNESS IN LOCALIZED EPITAXIAL STRUCTURES
    BILENKO, DI
    KAZANOVA, NP
    POLYANSKAYA, VP
    SOVIET MICROELECTRONICS, 1983, 12 (01): : 43 - 48
  • [9] Superconductivity Dependence on Epitaxial NbN Film Thickness
    Zhang, Qiyu
    Wang, Huiwu
    Tang, Xin
    Peng, Wei
    Wang, Zhen
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2019, 29 (05)
  • [10] INSITU MONITORING OF EPITAXIAL FILM THICKNESS BY IEMI
    YU, FH
    ZHOU, ZH
    STOUT, P
    REIF, R
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1992, 5 (01) : 34 - 40