RECOGNITION OF NONRADIATIVE RECOMBINATION CENTERS IN SEMIINSULATING GAAS

被引:10
|
作者
TUZEMEN, S
BREIVIK, L
BROZEL, MR
机构
[1] Dept. of Electr. Eng. and Electron., Univ. of Manchester Inst. of Sci. and Technol.
关键词
D O I
10.1088/0268-1242/7/1A/007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel technique, double-beam photoluminescence (DBPL), is introduced. This is used to investigate photoquenching effects of deep levels which affect near-band-edge photoluminescence (PL) in bulk-grown semi-insulating (SI) GaAs. We show that there is a remarkable increase in band-to-band radiative transition efficiency after photoquenching of near-band-edge absorption (also known as Reverse Contrast or RC) at low temperatures (less than 35 K) and associate this effect with a reduction in non-radiative recombination centres. We suggest that RC absorption does indeed map concentrations of the dominant recombination centre in SI GaAs and that the observed increase in luminescence after low-temperature illumination with light of near 1-mu-m wavelength is due to photoquenching of the RC defects.
引用
收藏
页码:A36 / A40
页数:5
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