FIELD-EMISSION CHARACTERISTICS OF CARBON TIPS

被引:27
|
作者
HOSOKI, S
YAMAMOTO, S
FUTAMOTO, M
FUKUHARA, S
机构
关键词
D O I
10.1016/0039-6028(79)90453-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:723 / 733
页数:11
相关论文
共 50 条
  • [1] Field-emission characteristics of carbon buckypaper
    Knapp, W
    Schleussner, D
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (01): : 557 - 561
  • [2] FIELD-ION AND FIELD-EMISSION MICROSCOPIC STUDIES OF CARBON TIPS
    FUTAMOTO, M
    HOSOKI, S
    KAWABE, U
    ULTRAMICROSCOPY, 1980, 5 (02) : 240 - 240
  • [3] Field-emission characteristics of carbon nanotube paste layers
    Oh, TS
    Yoo, JB
    Park, CY
    Lee, SE
    Lee, JH
    Kim, JM
    JOURNAL OF APPLIED PHYSICS, 2005, 98 (08)
  • [4] FIELD-EMISSION STUDIES OF OXYGEN ON SILVER TIPS
    CZANDERNA, AW
    FRANK, O
    SCHMIDT, WA
    SURFACE SCIENCE, 1973, 38 (01) : 129 - 138
  • [5] SHARP SILICON TIPS FOR AFM AND FIELD-EMISSION
    RANGELOW, IW
    MICROELECTRONIC ENGINEERING, 1994, 23 (1-4) : 369 - 372
  • [6] Field-emission characteristics of boron-carbon-nitride nanofilm
    Kimura, C
    Shima, H
    Okada, K
    Funakawa, S
    Sugino, T
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2005, 23 (05): : 1948 - 1951
  • [7] Field-Emission Characteristics of the Densified Carbon Nanotube Pillars Array
    Wang, Kang-Yu
    Liao, Chan-Yu
    Cheng, Huang-Chung
    ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, 2016, 5 (09) : M99 - M103
  • [8] Field-emission characteristics of carbon nanotubes and their applications in photonic devices
    Vaseashta, A
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2003, 14 (10-12) : 653 - 656
  • [9] TRANSFER CHARACTERISTICS OF CARBON-FIBER FIELD-EMISSION CURRENT
    BONDARENKO, BV
    CHEREPANOV, AY
    SHAKHOVSKOY, AG
    SHESHIN, EP
    RADIOTEKHNIKA I ELEKTRONIKA, 1989, 34 (06): : 1307 - 1310
  • [10] Field-emission characteristics of carbon nanotubes and their applications in photonic devices
    A. Vaseashta
    Journal of Materials Science: Materials in Electronics, 2003, 14 : 653 - 656