FIELD-ION AND FIELD-EMISSION MICROSCOPIC STUDIES OF CARBON TIPS

被引：0
|
作者：
FUTAMOTO, M [1 ]
HOSOKI, S [1 ]
KAWABE, U [1 ]
机构：
[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN
来源：
ULTRAMICROSCOPY | 1980年 / 5卷 / 02期
关键词：
D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：240 / 240
页数：1
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