CONCURRENT ERROR-DETECTION AND TESTING FOR LARGE PLAS

被引：9

作者：

KHAKBAZ, J ^{[1
]}

MCCLUSKEY, EJ ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT COMP SCI,CTR RELIABLE COMP,COMP SYST LAB,STANFORD,CA 94305

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1982年 / 29卷 / 04期

关键词：

D O I：

10.1109/T-ED.1982.20774

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：756 / 764

页数：9

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