EFFECT OF TEXTURE AND GRAIN-STRUCTURE ON ELECTROMIGRATION IN AL-0.5-PERCENT CU THIN-FILMS

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作者：
VAIDYA, S
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JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1981年 / 128卷 / 06期
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O646 [电化学、电解、磁化学];
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081704 ;
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页码：C239 / C239
页数：1
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