HIGH-LEVEL TEST-GENERATION FOR VLSI

被引：0
|
作者：
BHATTACHARYA, D
MURRAY, BT
HAYES, JP
机构：
[1] UNIV MICHIGAN,DEPT ELECT ENGN & COMP SCI,ADV COMP ARCHITECTURE LAB,ANN ARBOR,MI 48109
[2] YALE UNIV,NEW HAVEN,CT 06520
[3] GM CORP,RES LABS,WARREN,MI 48090
[4] UNIV MICHIGAN,DEPT ELECT ENGN,ANN ARBOR,MI 48109
来源：
COMPUTER | 1989年 / 22卷 / 04期
关键词：
D O I：
10.1109/2.25379
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：16 / 24
页数：9
相关论文
共 50 条
  • [1] DESIGNING FOR HIGH-LEVEL TEST-GENERATION
    BHATTACHARYA, D
    HAYES, JP
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1990, 9 (07) : 752 - 766
  • [2] A HIGH-LEVEL APPROACH TO TEST-GENERATION
    NARAIN, P
    SAAB, DG
    KUNDA, RP
    ABRAHAM, JA
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS, 1993, 40 (07): : 483 - 492
  • [3] RIDDLE - A FOUNDATION FOR TEST-GENERATION ON A HIGH-LEVEL DESIGN DESCRIPTION
    SILBERMAN, GM
    SPILLINGER, I
    IEEE TRANSACTIONS ON COMPUTERS, 1991, 40 (01) : 80 - 87
  • [4] CRG godel based high-level test generation algorithm for VLSI
    Lin Qiwei
    Zhu Li
    ICEMI 2007: PROCEEDINGS OF 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOL I, 2007, : 169 - 173
  • [5] CATE - A SOFTWARE TOOLSET FOR VLSI TEST-GENERATION
    DETTMER, R
    ELECTRONICS AND POWER, 1987, 33 (05): : 307 - 311
  • [6] TEST-GENERATION FOR VLSI CHIPS WITH EMBEDDED MEMORIES
    VIDATORKU, EK
    MONZEL, JA
    BOSSIS, TL
    RADKE, CE
    WU, DM
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1990, 34 (2-3) : 276 - 288
  • [7] MIXED LEVEL TEST-GENERATION FOR HIGH FAULT COVERAGE
    HUBNER, U
    HINSEN, H
    HOFEBAUER, M
    VIERHAUS, HT
    MICROPROCESSING AND MICROPROGRAMMING, 1991, 32 (1-5): : 791 - 796
  • [8] FUNCTIONAL LEVEL PRIMITIVES IN TEST-GENERATION
    BREUER, MA
    FRIEDMAN, AD
    IEEE TRANSACTIONS ON COMPUTERS, 1980, 29 (03) : 223 - 235
  • [9] ARCHITECTURAL LEVEL TEST-GENERATION FOR MICROPROCESSORS
    LEE, JS
    PATEL, JH
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1994, 13 (10) : 1288 - 1300
  • [10] TEST-GENERATION AND FAULT-DETECTION FOR VLSI PPL CIRCUITS
    AMIN, AAM
    SMITH, KF
    INTEGRATION-THE VLSI JOURNAL, 1989, 7 (03) : 303 - 324
12345