COMPUTER-SIMULATION OF SEM ELECTRON-BEAM INDUCED CURRENT IMAGES OF DISLOCATIONS AND STACKING-FAULTS

被引：44
|
作者：
DONOLATO, C
KLANN, H
机构：
[1] Max-Planck-Institut für Festkörperforschung, 7000 Stuttgart 80, Germany
来源：
JOURNAL OF APPLIED PHYSICS | 1980年 / 51卷 / 03期
关键词：
D O I：
10.1063/1.327767
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1624 / 1633
页数：10
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