X-RAY SPECTRAL ANALYSIS OF THIN FERRITE FILMS

被引：0
|
作者：
BONDAREN.GV [1 ]
IVANOVA, LB [1 ]
SADILOV, KA [1 ]
机构：
[1] KIRENSKII PHYS INST,KRASNOYARSK,USSR
来源：
ZAVODSKAYA LABORATORIYA | 1973年 / 06期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：688 / 691
页数：4
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