X-RAY SPECTRAL ANALYSIS OF THIN FERRITE FILMS

被引：0
|
作者：
BONDAREN.GV [1 ]
IVANOVA, LB [1 ]
SADILOV, KA [1 ]
机构：
[1] KIRENSKII PHYS INST,KRASNOYARSK,USSR
来源：
ZAVODSKAYA LABORATORIYA | 1973年 / 06期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：688 / 691
页数：4
相关论文
共 50 条
  • [1] X-ray analysis of thin films and multilayers
    Fewster, PF
    REPORTS ON PROGRESS IN PHYSICS, 1996, 59 (11) : 1339 - 1407
  • [2] X-RAY DIFFRACTION ANALYSIS OF THIN ALUMINA FILMS
    Yakovleva, O. A.
    Yakovlev, A. N.
    Yakovleva, N. M.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 502 - 502
  • [3] THIN LAYER CRITERION IN X-RAY SPECTRAL FLUORESCENCE ANALYSIS
    MAKOV, VM
    LOSEV, NF
    PAVLINSK.GV
    INDUSTRIAL LABORATORY, 1968, 34 (12): : 1761 - &
  • [4] X-RAY SPECTRAL FLUORESCENT ANALYSIS OF THIN PULP LAYERS
    BETIN, YP
    ZHABIN, EG
    KRAMPIT, IA
    ZAVODSKAYA LABORATORIYA, 1975, 41 (04): : 426 - 428
  • [5] X-ray and neutron reflectivity analysis of thin films and superlattices
    Zabel, H.
    Applied Physics A: Solids and Surfaces, 1994, 58 (03): : 159 - 168
  • [6] X-ray diffraction analysis of crystallization of SbxSey thin films
    Bao, HF
    Ye, SI
    Yuan, BH
    Lan, MJ
    Zhou, SR
    Wang, Q
    OPTICAL THIN FILMS V: NEW DEVELOPMENTS, 1997, 3133 : 140 - 146
  • [7] Features of Wavelet Analysis in X-Ray Reflectometry of Thin Films
    Astaf'ev, S. B.
    Yanusova, L. G.
    CRYSTALLOGRAPHY REPORTS, 2018, 63 (05) : 791 - 795
  • [8] CHEMICAL ANALYSIS OF THIN FILMS BY X-RAY EMISSION SPECTROSCOPY
    RHODIN, TN
    ANALYTICAL CHEMISTRY, 1955, 27 (02) : 316 - 316
  • [9] X-RAY PHOTOELECTRON AND AUGER ANALYSIS OF THIN-FILMS
    CHANG, CC
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02): : 276 - 281
  • [10] X-ray texture analysis of oriented PZT thin films
    Peterson, CR
    Medendorp, NW
    Slamovich, EB
    Bowman, KJ
    FERROELECTRIC THIN FILMS V, 1996, 433 : 297 - 302
12345