REVERSIBLE COUNTING DECADE ON INTEGRAL CIRCUITS WITH NUMERICAL INDICATION

被引:0
|
作者
VESHKURTSEV, YM [1 ]
PETROV, AY [1 ]
机构
[1] OMSK POLYTECH INST, OMSK, USSR
来源
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:78 / 80
页数:3
相关论文
共 50 条
  • [41] 3 DECADE BANDWIDTH HYBRID CIRCUITS
    NORTON, DE
    MICROWAVE JOURNAL, 1988, 31 (11) : 117 - &
  • [42] Equivalence Checking of Reversible Circuits
    Wille, Robert
    Grosse, Daniel
    Miller, D. Michael
    Drechsler, Rolf
    JOURNAL OF MULTIPLE-VALUED LOGIC AND SOFT COMPUTING, 2012, 19 (04) : 361 - 378
  • [43] Fault testing for reversible circuits
    Patel, KN
    Hayes, JP
    Markov, IL
    21ST IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2003, : 410 - 416
  • [44] Synthesis of reversible logic circuits
    Shende, VV
    Prasad, AK
    Markov, IL
    Hayes, JP
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2003, 22 (06) : 710 - 722
  • [45] FAST REVERSIBLE DECADE COUNTER.
    Melen', M.V.
    Instruments and experimental techniques New York, 1980, 23 (5 pt 1): : 1140 - 1142
  • [46] On the fault testing for reversible circuits
    Tayu, Satoshi
    Ito, Shigeru
    Ueno, Shuichi
    ALGORITHMS AND COMPUTATION, 2007, 4835 : 812 - 821
  • [47] Fault testing for reversible circuits
    Patel, KN
    Hayes, JP
    Markov, IL
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2004, 23 (08) : 1220 - 1230
  • [48] On Fault Testing for Reversible Circuits
    Tayu, Satoshi
    Ito, Shigeru
    Ueno, Shuichi
    IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2008, E91D (12) : 2770 - 2775
  • [49] The Algorithm for Reversible Circuits Synthesis
    Skorupski, Andrzej
    Gracki, Krzysztof
    INTERNATIONAL JOURNAL OF ELECTRONICS AND TELECOMMUNICATIONS, 2020, 66 (02) : 281 - 286
  • [50] Equivalence Checking of Reversible Circuits
    Wille, Robert
    Grosse, Daniel
    Miller, D. Michael
    Drechsler, Rolf
    ISMVL: 2009 39TH IEEE INTERNATIONAL SYMPOSIUM ON MULTIPLE-VALUED LOGIC, 2009, : 324 - +