INEXPENSIVE SPOT-PROFILE ANALYSIS REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION

A simple, photomultiplier based spot-profile analysis reflection high energy electron diffraction (SPARHEED) apparatus is described. A micrometer scanned, two pinhole aperture is coupled to an optical fiber and yields 38 mum spot-profile intensity resolution of RHEED patterns corresponding to an ultimate spatial resolution of approximately 4000 angstrom along the RHEED pattern and 900 A across the RHEED pattern. Long range scanning also allows for surface lattice net determination. Acquisition of selected RHEED intensity oscillations is straightforward. The device is easily mounted, rigid, and inexpensive.