P-CHANNEL AMORPHOUS-SILICON TFTS WITH HIGH HOLE MOBILITY

被引:0
|
作者
ODA, S [1 ]
ADACHI, N [1 ]
KATOH, S [1 ]
MATSUMURA, M [1 ]
机构
[1] TOKYO INST TECHNOL,MEGURO KU,TOKYO 152,JAPAN
关键词
D O I
10.1109/16.8877
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:2448 / 2448
页数:1
相关论文
共 50 条
  • [31] PHOTOCONDUCTIVITY STUDIES OF THE MOBILITY EDGE IN AMORPHOUS-SILICON
    SPEAR, WE
    ALANI, H
    LECOMBER, PG
    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1981, 43 (05): : 781 - 796
  • [32] ANISOTROPIC DRIFT MOBILITY IN HYDROGENATED AMORPHOUS-SILICON
    PARKER, MA
    SCHIFF, EA
    PHYSICAL REVIEW B, 1988, 37 (17): : 10426 - 10428
  • [33] UNIVERSAL EFFECTIVE MOBILITY OF EMPIRICAL LOCAL MOBILITY MODELS FOR N-CHANNEL AND P-CHANNEL SILICON MOSFETS
    WONG, HS
    SOLID-STATE ELECTRONICS, 1993, 36 (02) : 179 - 188
  • [34] Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTs
    Lin, Chia-Sheng
    Chen, Ying-Chung
    Chang, Ting-Chang
    Chen, Shih-Ching
    Jian, Fu-Yen
    Li, Hung-Wei
    Chen, Te-Chih
    Weng, Chi-Feng
    Lu, Jin
    Hsu, Wei-Che
    IEEE ELECTRON DEVICE LETTERS, 2009, 30 (11) : 1179 - 1181
  • [35] Hydrogen-Defect Termination in SnO for p-Channel TFTs
    Lee, Alex W.
    Le, Dong
    Matsuzaki, Kosuke
    Nomura, Kenji
    ACS APPLIED ELECTRONIC MATERIALS, 2020, 2 (04) : 1162 - 1168
  • [36] Self-aligned amorphous-silicon TFTs on clear plastic substrates
    Cheng, IC
    Kattamis, AZ
    Long, K
    Sturm, JC
    Wagner, S
    IEEE ELECTRON DEVICE LETTERS, 2006, 27 (03) : 166 - 168
  • [37] FINE ACTIVE MATRIX USING SOI P-CHANNEL TFTS
    MIMURA, A
    OHWADA, J
    HOSOKAWA, Y
    SUZUKI, T
    KAWAKAMI, H
    MIYATA, K
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (08) : C367 - C367
  • [38] Characteristics of polysilicon TFTs, hydrogenated by ion implantation p-channel
    Aleksandrova, P
    Gueorguiev, V
    Ivanov, T
    Popova, L
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2005, 7 (01): : 313 - 316
  • [39] HOLE DRIFT MOBILITY IN AMORPHOUS SILICON
    ALLAN, D
    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1978, 38 (04): : 381 - 392
  • [40] Degradation mechanism in low-temperature p-channel polycrystalline silicon TFTs under dynamic stress
    Toyota, Y.
    Matsumura, M.
    Hatano, M.
    Shiba, T.
    Ohkura, M.
    2006 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 44TH ANNUAL, 2006, : 729 - 730