SILICON-CHROMIUM THIN-FILM RESISTOR RELIABILITY

被引：10
|
作者：
WAITS, RK [1 ]
机构：
[1] FAIRCHILD CAMERA & INSTR CORP,SEMICOND COMPONENTS GRP,MT VIEW,CA 94040
来源：
THIN SOLID FILMS | 1973年 / 16卷 / 02期
关键词：
D O I：
10.1016/0040-6090(73)90172-7
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
下载
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页码：237 / 247
页数：11
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