THIN-FILM INTEGRATED ELECTRONIC RELIABILITY

被引：1
|
作者：
IRELAND, JW
FRESH, DL
机构：
来源：
PROCEEDINGS OF THE IEEE | 1964年 / 52卷 / 12期
关键词：
D O I：
10.1109/PROC.1964.3458
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：1635 / &
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