SILICON-CHROMIUM THIN-FILM RESISTOR RELIABILITY

被引：10

作者：

WAITS, RK ^{[1
]}

机构：

[1] FAIRCHILD CAMERA & INSTR CORP,SEMICOND COMPONENTS GRP,MT VIEW,CA 94040

来源：

关键词：

D O I：

10.1016/0040-6090(73)90172-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：237 / 247

页数：11

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