PERFECTED METHOD OF MEASURING DIELECTRIC PERMITTIVITY OF SUBSTRATES FOR MICROWAVE INTEGRATED-CIRCUITS

被引：0
|
作者：
ZALTSMAN, EB
KOUDELNYI, AV
机构：
来源：
MEASUREMENT TECHNIQUES | 1977年 / 20卷 / 07期
关键词：
D O I：
10.1007/BF00826078
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：1072 / 1075
页数：4
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