PERFECTED METHOD OF MEASURING DIELECTRIC PERMITTIVITY OF SUBSTRATES FOR MICROWAVE INTEGRATED-CIRCUITS

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作者：

ZALTSMAN, EB

KOUDELNYI, AV

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来源：

MEASUREMENT TECHNIQUES | 1977年 / 20卷 / 07期

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D O I：

10.1007/BF00826078

中图分类号：

T [工业技术];

学科分类号：

08 ;

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页码：1072 / 1075

页数：4

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