PERFECTED METHOD OF MEASURING DIELECTRIC PERMITTIVITY OF SUBSTRATES FOR MICROWAVE INTEGRATED-CIRCUITS

被引：0

作者：

ZALTSMAN, EB

KOUDELNYI, AV

机构：

来源：

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D O I：

10.1007/BF00826078

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1072 / 1075

页数：4

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[1] DIELECTRIC WAVEGUIDE MICROWAVE INTEGRATED-CIRCUITS - OVERVIEW
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