共 50 条
- [1] INFLUENCE OF ELECTRON IRRADIATION ON THE HALL MOBILITY OF HOLES IN INVERSION LAYERS OF METAL-OXIDE-SEMICONDUCTOR STRUCTURES. Soviet physics. Semiconductors, 1980, 14 (04): : 451 - 454
- [3] DETERMINATION OF THE HALL DENSITY AND MOBILITY OF CARRIERS IN INVERSION-LAYERS ON SEMICONDUCTOR SURFACES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1985, 19 (06): : 616 - 618
- [5] MOBILITY OF HOLES IN SILICON INVERSION LAYERS IN METAL-DIELECTRIC-SEMICONDUCTOR STRUCTURES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1971, 4 (11): : 1755 - &
- [6] QUANTUM HALL-EFFECT IN SILICON METAL-OXIDE-SEMICONDUCTOR INVERSION-LAYERS - EXPERIMENTAL CONDITIONS FOR DETERMINATION OF H/E2 PHYSICAL REVIEW B, 1986, 33 (10): : 6874 - 6896
- [7] CYCLOTRON-RESONANCE OF ELECTRON INVERSION-LAYERS IN SI(001) METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS (MOSFETS) PHYSICAL REVIEW B, 1980, 22 (02): : 945 - 958