ONSET OF DEFECTS IN N+ SILICON-DOPED GAAS

被引:0
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作者
URE, JW [1 ]
STIRLAND, DJ [1 ]
AUGUSTUS, PD [1 ]
DAVIS, R [1 ]
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[1] PLESSEY CO LTD,ALLEN CLARK RES CTR,TOWCHESTER NN12 8EQ,NORTHAMPTONSHIR,ENGLAND
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:711 / 712
页数:2
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