ON EVALUATION OF WARRANTY ASSURANCE WHEN LIFE HAS A WEIBULL DISTRIBUTION

被引：17

|

作者：

MANN, NR

SAUNDERS, SC

机构：

来源：

BIOMETRIKA | 1969年 / 56卷 / 03期

关键词：

D O I：

10.2307/2334669

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

收藏

页码：615 / &

相关论文

共 50 条

[21] Sequential life testing with an underlying Weibull sampling distribution
de Souza, DI
SAFETY AND RELIABILITY, VOLS 1 & 2, 1999, : 869 - 874
[22] Reliability Life Analysis Based on New Weibull Distribution
Suo Wenli
Li Changguo
Guo Yan
Liu Zhenzhen
PROCEEDINGS OF 2010 INTERNATIONAL CONFERENCE ON RISK AND RELIABILITY MANAGEMENT, 2010, : 161 - 167
[23] Evaluation of the bias in using the time to the first event when the inter-event intervals have a Weibull distribution
Rose, MS
Gillis, AM
Sheldon, RS
STATISTICS IN MEDICINE, 1999, 18 (02) : 139 - 154
[24] Reliability-Equivalent Field Reference Usage and Stress Level When Both are Random for Product with Weibull Life Distribution
Sun, Fengbin
2020 ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS 2020), 2020,
[25] Evaluation of Core Tensile Strength Using the Weibull Distribution
Giese, S. R.
TRANSACTIONS OF THE AMERICAN FOUNDRY SOCIETY, VOL 121, 2013, 121 : 365 - 374
[26] ON THE DERIVATION AND NUMERICAL EVALUATION OF THE WEIBULL-RICIAN DISTRIBUTION
NILSSON, AA
GLISSON, TH
IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1980, 16 (06) : 864 - 867
[27] Sequential Sampling Plan in the Truncated Life Test for Weibull Distribution
Rasay, Hasan
Pourgharibshahi, Morteza
Fallahnezhad, Mohammad Saber
JOURNAL OF TESTING AND EVALUATION, 2018, 46 (02) : 693 - 703
[28] BAYESIAN ESTIMATION OF LIFE PARAMETERS AND RELIABILITY FUNCTION IN WEIBULL DISTRIBUTION
RAO, ANV
TSOKOS, CP
NOTICES OF THE AMERICAN MATHEMATICAL SOCIETY, 1975, 22 (01): : A243 - A243
[29] LIFE TESTS WITH PERIODIC CHANGE IN SCALE PARAMETER OF A WEIBULL DISTRIBUTION
SRIVASTAVA, TN
IEEE TRANSACTIONS ON RELIABILITY, 1974, R 23 (02) : 115 - 118
[30] Reliability analysis for accelerated life test based on Weibull distribution
Li L.
Xu W.
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics, 2010, 32 (07): : 1544 - 1548

← 1 2 3 4 5 →