Reliability-Equivalent Field Reference Usage and Stress Level When Both are Random for Product with Weibull Life Distribution

被引：0

作者：

Sun, Fengbin ^{[1
,2
]}

机构：

[1] Tesla Inc, Reliabil Engn, Palo Alto, CA 94304 USA

[2] Tesla Inc, Mfg Reliabil, Palo Alto, CA 94304 USA

来源：

2020 ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS 2020) | 2020年

关键词：

Distributed usage and stress; Reference value; Reliability equivalence; Life test design; Weibull life;

D O I：

10.1109/rams48030.2020.9153726

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

This paper derives, based on reliability equivalence principle, the analytic expression of the equivalent single valued usage and stress level when the underlying life distribution is Weibull with a known shape parameter (slope). Numerical example is provided to illustrate the advantage of the method for reliability life test design over the traditional practice, especially for a high-reliability product.

引用

页数：6