PREDICTION ANALYSIS AND THE RELIABILITY OF A MASTERY TEST

被引:2
|
作者
WILCOX, RR
机构
关键词
D O I
10.1177/001316447903900416
中图分类号
G44 [教育心理学];
学科分类号
0402 ; 040202 ;
摘要
引用
收藏
页码:825 / 839
页数:15
相关论文
共 50 条
  • [31] ACCURACY OF 2 PROCEDURES FOR ESTIMATING RELIABILITY OF MASTERY TESTS
    HUYNH, H
    SAUNDERS, JC
    JOURNAL OF EDUCATIONAL MEASUREMENT, 1980, 17 (04) : 351 - 358
  • [32] A Reliability Prediction Method Based on Simulation Analysis
    Luo Xuegang
    2014 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON AEROSPACE TECHNOLOGY, APISAT2014, 2015, 99 : 219 - 223
  • [33] Advances in Prediction and Analysis of Systems Reliability INTRODUCTION
    Verma, Ajit K.
    Papic, Ljubisa
    INTERNATIONAL JOURNAL OF RELIABILITY QUALITY & SAFETY ENGINEERING, 2009, 16 (06): : V - VI
  • [34] RKAPPA - RELIABILITY OF MASTERY TESTS - AN APPLICATION OF THE RASCH MODEL
    PHILLIPS, GW
    GEDEIK, SS
    APPLIED PSYCHOLOGICAL MEASUREMENT, 1984, 8 (03) : 286 - 286
  • [35] Reliability Testing, Analysis and Prediction of Balancing Resistors
    Kaveh, Mehdi
    Yellamati, David
    Goktas, Yavuz
    2012 PROCEEDINGS - ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS), 2012,
  • [36] Reliability prediction through critical area analysis
    Mattick, JHN
    Kelsall, RW
    Miles, RE
    1995 INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP, FINAL REPORT, 1996, : 167 - 167
  • [37] ANALYSIS OF SOFTWARE RELIABILITY PREDICTION MODELS.
    Sukert, Alan N.
    AGARD Conference Proceedings, 1979, (261): : 1 - 34
  • [38] TEST OF RELIABILITY OF A COMPONENTIAL ANALYSIS OF MOTION VERBS
    GALLIVAN, J
    PERCEPTUAL AND MOTOR SKILLS, 1986, 62 (02) : 631 - 636
  • [39] Accelerated Test for Reliability Analysis of SiC Diodes
    Banu, Viorel
    Jorda, Xavier
    Montserrat, Josep
    Godignon, Philippe
    Millan, Jose
    Brosselard, Pierre
    2009 21ST INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, 2009, : 267 - +
  • [40] Reliability test and failure analysis of optical MEMS
    Dürr, P
    Dauderstädt, U
    Kunze, D
    Auvert, M
    Lakner, H
    PROCEEDINGS OF THE 9TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS, 2002, : 201 - 206