THE OXIDATION OF CHEMICALLY VAPOR-DEPOSITED SILICON-NITRIDE AND SILICON-NITRIDE COATED GRAPHITE

被引:2
|
作者
FERGUS, JW [1 ]
WORRELL, WL [1 ]
机构
[1] UNIV PENN,DEPT MAT SCI & ENGN,PHILADELPHIA,PA 19104
关键词
D O I
10.1149/1.2043862
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Chemically vapor deposited (CVD) Si3N4 is one of the highest purity forms of Si3N4 currently available, so the protective silica scale formed during oxidation in a pure oxygen atmosphere is also of high purity. The oxidation of CVD Si3N4 and CVD Si(3)M(4) coated graphite in 1 atm dry oxygen at 1500 degrees C has been measured and is compared with results from the literature for the growth of high purity silica on CVD Si3N4 and on CVD SiC.
引用
收藏
页码:183 / 185
页数:3
相关论文
共 50 条
  • [1] OXIDATION OF CHEMICALLY VAPOR-DEPOSITED SILICON-NITRIDE FILMS
    MAEDA, K
    SATO, J
    [J]. DENKI KAGAKU, 1977, 45 (05): : 304 - 308
  • [2] CHEMICAL VAPOR-DEPOSITED AMORPHOUS SILICON-NITRIDE
    HIRAI, T
    NIIHARA, K
    HAYASHI, S
    GOTO, T
    [J]. SCIENCE REPORTS OF THE RESEARCH INSTITUTES TOHOKU UNIVERSITY SERIES A-PHYSICS CHEMISTRY AND METALLURGY, 1977, 26 (4-5): : 185 - 201
  • [3] CRYSTALLIZATION AND SINTERING CHARACTERISTICS OF CHEMICALLY VAPOR-DEPOSITED SILICON-NITRIDE POWDERS
    GOMEZALEIXANDRE, C
    ALBELLA, JM
    MARTINEZDUART, JM
    ORGAZ, F
    [J]. JOURNAL OF MATERIALS RESEARCH, 1992, 7 (10) : 2864 - 2868
  • [4] MATERIAL AND TRIBOLOGICAL PROPERTIES OF PLASMA ENHANCED CHEMICALLY VAPOR-DEPOSITED SILICON-NITRIDE
    KOVAC, Z
    NOVOTNY, VJ
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1989, 197 : 25 - COLL
  • [5] CORRELATION BETWEEN STRESS AND STRUCTURE IN CHEMICALLY VAPOR-DEPOSITED SILICON-NITRIDE FILMS
    NOSKOV, AG
    GOROKHOV, EB
    SOKOLOVA, GA
    TRUKHANOV, EM
    STENIN, SI
    [J]. THIN SOLID FILMS, 1988, 162 (1-2) : 129 - 143
  • [6] OXIDATION OF CHEMICALLY-VAPOR-DEPOSITED SILICON-NITRIDE AND SINGLE-CRYSTAL SILICON
    CHOI, DJ
    FISCHBACH, DB
    SCOTT, WD
    [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1989, 72 (07) : 1118 - 1123
  • [7] CHARACTERIZATION OF CHEMICALLY VAPOR-DEPOSITED SILICON-NITRIDE FILMS FROM DISILANE AND AMMONIA
    HENDA, R
    LAANAB, L
    SCHEID, E
    FOURMEAUX, R
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1995, 34 (4A): : L437 - L439
  • [8] OXIDATION OF PLASMA ENHANCED CHEMICAL VAPOR-DEPOSITED SILICON-NITRIDE AND OXYNITRIDE FILMS
    DENISSE, CMM
    SMULDERS, HE
    HABRAKEN, FHPM
    VANDERWEG, WF
    [J]. APPLIED SURFACE SCIENCE, 1989, 39 (1-4) : 25 - 32
  • [9] OXIDATION OF CHEMICALLY VAPOR-DEPOSITED SILICON-NITRIDE IN DRY OXYGEN AT 1923-K TO 2003-K
    NARUSHIMA, T
    LIN, RY
    IGUCHI, Y
    HIRAI, T
    [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1993, 76 (04) : 1047 - 1051
  • [10] CHEMICAL VAPOR-DEPOSITED SILICON-NITRIDE .3. STRUCTURAL FEATURES
    NIIHARA, K
    HIRAI, T
    [J]. JOURNAL OF MATERIALS SCIENCE, 1977, 12 (06) : 1233 - 1242