HIGH-RESOLUTION TIME-OF-FLIGHT ELECTRON SPECTROMETER

被引:6
|
作者
UEHARA, Y [1 ]
USHIROKU, T [1 ]
USHIODA, S [1 ]
MURATA, Y [1 ]
机构
[1] UNIV TOKYO,INST SOLID STATE PHYS,MINATO KU,TOKYO 106,JAPAN
关键词
TOF; HIGH RESOLUTION ELECTRON SPECTROMETER; NEA ELECTRON EMITTER;
D O I
10.1143/JJAP.29.2858
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have developed a high resolution time-of-flight (TOF) electron spectrometer. To attain the high resolution, a new high speed electron gate was developed for precise flight time measurement. The time resolution of this gate improves for slow electrons and it is a few hundred picoseconds for an electron beam of a few eV. To evaluate the performance of the TOF spectrometer, we have measured the energy distribution of electrons emitted form NEA GaAs irradiated by a 820 nm GaAlAs laser with a 60 ps pulse width. The spectrometer including the gate works as intended and the highest resolution achieved is 3 meV for the electron flight energy of 3 eV.
引用
收藏
页码:2858 / 2863
页数:6
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