SCANNING TUNNELING MICROSCOPY AT POTENTIAL CONTROLLED ELECTRODE SURFACES IN ELECTROLYTIC ENVIRONMENT

被引：124

作者：

LUSTENBERGER, P

ROHRER, H

CHRISTOPH, R

SIEGENTHALER, H

机构：

[1] IBM CORP,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

[2] UNIV BERN,INST ANORGAN ANALYT & PHYS CHEM,CH-3012 BERN,SWITZERLAND

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1988年 / 243卷 / 01期

关键词：

D O I：

10.1016/0022-0728(88)85043-5

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：225 / 235

页数：11

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