HIGH-RESOLUTION ELECTRON-MICROSCOPY WITH PHASE PLATES

被引：0
|
作者：
THON, F [1 ]
WILLASCH, D [1 ]
机构：
[1] SIEMENS AG MESSGERATEWERK,BERLIN,GERMANY
来源：
MIKROSKOPIE | 1973年 / 28卷 / 11-1期
关键词：
D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：364 / 365
页数：2
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