HIGH-RESOLUTION ELECTRON-MICROSCOPY WITH PHASE PLATES

被引：0

|

作者：

THON, F ^{[1
]}

WILLASCH, D ^{[1
]}

机构：

[1] SIEMENS AG MESSGERATEWERK,BERLIN,GERMANY

来源：

MIKROSKOPIE | 1973年 / 28卷 / 11-1期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：364 / 365

页数：2

相关论文

共 50 条

[21] HIGH-RESOLUTION ANALYTICAL ELECTRON-MICROSCOPY
CARPENTER, RW
PHYSICS TODAY, 1981, 34 (03) : 34 - &
[22] WORKSHOP ON HIGH-RESOLUTION ELECTRON-MICROSCOPY
不详
MICRON, 1977, 8 (03) : 173 - 174
[23] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
GIBSON, JM
MRS BULLETIN, 1991, 16 (03) : 27 - 33
[24] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
GRUEHN, R
ROSS, R
CHEMIE IN UNSERER ZEIT, 1987, 21 (06) : 194 - 206
[25] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF DUMORTIERITE
VANDYCK, D
TAMBUYSER, P
VANLANDUYT, J
AMELINCKX, S
TRANSACTIONS-AMERICAN GEOPHYSICAL UNION, 1976, 57 (08): : 603 - 603
[26] HIGH-RESOLUTION SCANNING ELECTRON-MICROSCOPY
JOY, DC
PAWLEY, JB
ULTRAMICROSCOPY, 1992, 47 (1-3) : 80 - 100
[27] WORKSHOP ON HIGH-RESOLUTION ELECTRON-MICROSCOPY
不详
METALLOGRAPHY, 1978, 11 (02): : 126 - 128
[28] HIGH-RESOLUTION ELECTRON-MICROSCOPY AND MICRODIFFRACTION
COWLEY, JM
ULTRAMICROSCOPY, 1985, 18 (1-4) : 11 - 17
[29] LATTICE IMAGING BY HIGH-RESOLUTION ELECTRON-MICROSCOPY - ROLE OF HIGH-RESOLUTION ELECTRON-MICROSCOPY IN SOLID-STATE CHEMISTRY
ANDERSON, JS
PROCEEDINGS OF THE INDIAN ACADEMY OF SCIENCES SECTION A, 1978, 87 (10): : 295 - &
[30] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF HETEROSTRUCTURES
CERVA, H
SOLID-STATE ELECTRONICS, 1994, 37 (4-6) : 1045 - 1052

← 1 2 3 4 5 →