HIGH-RESOLUTION ELECTRON-MICROSCOPY WITH PHASE PLATES

被引：0

|

作者：

THON, F ^{[1
]}

WILLASCH, D ^{[1
]}

机构：

[1] SIEMENS AG MESSGERATEWERK,BERLIN,GERMANY

来源：

MIKROSKOPIE | 1973年 / 28卷 / 11-1期

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D O I：

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中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：364 / 365

页数：2

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