MECHANISM OF BREAKDOWN IN THIN DIELECTRIC FILMS

被引:0
|
作者
BLINOV, GA
机构
来源
SOVIET PHYSICS SOLID STATE,USSR | 1971年 / 12卷 / 08期
关键词
D O I
暂无
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:1997 / +
页数:1
相关论文
共 50 条
  • [41] CENSORED WEIBULL STATISTICS IN THE DIELECTRIC-BREAKDOWN OF THIN OXIDE-FILMS
    ROWLAND, SM
    HILL, RM
    DISSADO, LA
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1986, 19 (31): : 6263 - 6285
  • [42] ON THE WEAK SPOT CONCEPT IN THE DIELECTRIC-BREAKDOWN OF THIN POLYMER-FILMS
    SABA, A
    LAURENT, C
    SEGUI, Y
    PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON CONDUCTION AND BREAKDOWN IN SOLID DIELECTRICS, 1989, : 72 - 76
  • [43] MODEL FOR DIELECTRIC BREAKDOWN IN PLASMA-POLYMERIZED STYRENE THIN FILMS.
    HIKITA, MASAYUKI
    MATSUDA, AKINORI
    NAGAO, MASAYUKI
    SAWA, GORO
    IEDA, MASAYUKI
    1982, V 21 (N 3): : 483 - 489
  • [44] DIELECTRIC-BREAKDOWN AND ELECTRICAL-CONDUCTION IN POLYIMIDE THIN-FILMS
    ZALAR, SM
    GALLAGHER, JF
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (08) : C373 - C373
  • [45] High Dielectric Breakdown Strength Nanoplatelet-Based Multilayer Thin Films
    Palen, Bethany
    Iverson, Ethan T.
    Rabaey, Matthew G.
    Marjuban, Shaik Merkatur Hakim
    Long, Carolyn T.
    Kolibaba, Thomas J.
    Benson, Annie
    Castaneda-Lopez, Homero
    Grunlan, Jaime C.
    MACROMOLECULAR MATERIALS AND ENGINEERING, 2023, 308 (05)
  • [46] Characterization of the Dielectric Breakdown Strength of Thin Elastic Films in Various Ambient Media
    Foerster-Zuegel, Florentine
    Braisz, Lukas
    Schlaak, Helmut F.
    2016 IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD), VOLS 1-2, 2016, : 569 - 572
  • [47] Electric breakdown of dielectric thin films for high-voltage display applications
    Mozolevskis, Gatis
    Nitiss, Edgards
    Medvids, Arturs
    HOLOGRAPHY, DIFFRACTIVE OPTICS, AND APPLICATIONS VII, 2017, 10022
  • [48] Post-breakdown conduction mechanism of thin oxide films and their aspects
    Komiya, K
    Oka, T
    Okada, N
    Omura, Y
    ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS, 2003, 86 (03): : 21 - 27
  • [49] NOVEL MECHANISM FOR TUNNELING AND BREAKDOWN OF THIN SIO2-FILMS
    RICCO, B
    AZBEL, MY
    BRODSKY, MH
    PHYSICAL REVIEW LETTERS, 1983, 51 (19) : 1795 - 1798
  • [50] Dielectric breakdown mechanism of multilayered films for novel high energy density capacitors
    Zhou, Zheng
    Mackey, Matthew
    Baer, Eric
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2013, 245