MECHANISM OF BREAKDOWN IN THIN DIELECTRIC FILMS

被引：0
|
作者：
BLINOV, GA
机构：
来源：
SOVIET PHYSICS SOLID STATE,USSR | 1971年 / 12卷 / 08期
关键词：
D O I：
暂无
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
收藏
页码：1997 / +
页数：1
相关论文
共 50 条
  • [31] Dielectric breakdown and electroforming phenomenon in the cadmium arsenide thin films devices
    Din, MBH
    Gould, RD
    ICSE'98: 1998 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS, 1998, : 179 - 183
  • [32] Nanobrick Wall Multilayer Thin Films with High Dielectric Breakdown Strength
    Iverson, Ethan T.
    Legendre, Hudson
    Chavan, Shubham V.
    Aryal, Anil
    Singh, Maninderjeet
    Chakravarty, Sourav
    Schmieg, Kendra
    Chiang, Hsu-Cheng
    Shamberger, Patrick J.
    Karim, Alamgir
    Grunlan, Jaime C.
    ACS APPLIED ENGINEERING MATERIALS, 2023, 1 (09): : 2429 - 2439
  • [33] DIELECTRIC INSTABILITY AND BREAKDOWN IN SIO2 THIN-FILMS
    DISTEFANO, TH
    SHATZKES, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (01): : 50 - 54
  • [34] Dielectric breakdown mechanism in thick SiO2 films revisited
    Kubota, K
    Kamakura, Y
    Taniguchi, K
    Sugahara, Y
    Shimizu, R
    ISPSD '04: PROCEEDINGS OF THE 16TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, 2004, : 229 - 232
  • [35] ON THE DOMINANT TRANSPORT MECHANISM IN VERY THIN DIELECTRIC FILMS
    SHOUSHA, AHM
    SOLID STATE COMMUNICATIONS, 1981, 40 (06) : 647 - 649
  • [36] PULSE BREAKDOWN IN DIELECTRIC FILMS
    VOROBEV, GA
    MUKHACHE.VA
    SOVIET PHYSICS SOLID STATE,USSR, 1971, 12 (09): : 2091 - +
  • [37] DIELECTRIC BREAKDOWN OF POLYMER FILMS
    BLOK, J
    LEGRAND, DG
    JOURNAL OF APPLIED PHYSICS, 1969, 40 (01) : 288 - &
  • [38] STATISTICAL APPROACH TO ANALYSIS OF DIELECTRIC-BREAKDOWN STRENGTH OF THIN INSULATING FILMS
    KRISTIANSEN, K
    VACUUM, 1977, 27 (04) : 227 - 233
  • [39] Dielectric breakdown mechanism of thin-SiO2 studied by the post-breakdown resistance statistics
    Satake, H
    Toriumi, A
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2000, 47 (04) : 741 - 745
  • [40] SWITCHING PROCESSES AND DIELECTRIC BREAKDOWN IN NIO AND NIO (LI) THIN-FILMS
    LEUNG, B
    LALEVIC, B
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (01): : 16 - 16
12345