COMPARING CATHODE LENS CONFIGURATIONS FOR LOW-ENERGY ELECTRON-MICROSCOPY

被引：0
|
作者：
CHMELIK, J
VENEKLASEN, L
MARX, G
机构：
[1] TECH UNIV CLAUSTHAL,INST PHYS,W-3392 CLAUSTHAL ZELLERFE,GERMANY
[2] CZECHOSLOVAK ACAD SCI,INST SCI INSTRUMENTS,BRNO,CZECHOSLOVAKIA
来源：
OPTIK | 1989年 / 83卷 / 05期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：155 / 160
页数：6
相关论文
共 50 条
  • [21] A LOW-ENERGY ELECTRON-MICROSCOPY STUDY OF THE SYSTEM SI(111)-AU
    SWIECH, W
    BAUER, E
    MUNDSCHAU, M
    SURFACE SCIENCE, 1991, 253 (1-3) : 283 - 296
  • [22] DEFECTS ON THE SURFACE OF MO(011) OBSERVED BY LOW-ENERGY ELECTRON-MICROSCOPY
    MUNDSCHAU, M
    BAUER, E
    SWIECH, W
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1989, 59 (02): : 217 - 226
  • [23] THE ROLE OF LEDGES IN VAPOR SOLID-PHASE TRANSFORMATIONS OBSERVED BY LOW-ENERGY ELECTRON-MICROSCOPY AND PHOTOEMISSION ELECTRON-MICROSCOPY
    MUNDSCHAU, M
    BAUER, E
    SWIECH, W
    METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1991, 22 (06): : 1311 - 1315
  • [24] INITIAL EPITAXIAL-GROWTH OF COPPER SILICIDE ON SI(111) STUDIED BY LOW-ENERGY ELECTRON-MICROSCOPY AND PHOTOEMISSION ELECTRON-MICROSCOPY
    MUNDSCHAU, M
    BAUER, E
    TELIEPS, W
    SWIECH, W
    JOURNAL OF APPLIED PHYSICS, 1989, 65 (12) : 4747 - 4752
  • [25] Scanning low-energy electron microscopy
    Müllerová, I
    Frank, L
    ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 128, 2003, 128 : 309 - 443
  • [26] LOW-ENERGY ELECTRON PROJECTION MICROSCOPY
    STOCKER, W
    FINK, HW
    MORIN, R
    JOURNAL DE PHYSIQUE, 1989, 50 (C8): : C8519 - C8521
  • [27] eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument
    Geelen, Daniel
    Thete, Aniket
    Schaff, Oliver
    Kaiser, Alexander
    van der Molen, Sense Jan
    Tromp, Rudolf
    ULTRAMICROSCOPY, 2015, 159 : 482 - 487
  • [28] THE REACTION OF OXYGEN WITH THE HOT W(001) SURFACE STUDIED BY LOW-ENERGY ELECTRON-MICROSCOPY
    ALTMAN, MS
    BAUER, E
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03): : 659 - 660
  • [29] The EIGER detector for low-energy electron microscopy and photoemission electron microscopy
    Tinti, G.
    Marchetto, H.
    Vaz, C. A. F.
    Kleibert, A.
    Andrae, M.
    Barten, R.
    Bergamaschi, A.
    Brueckner, M.
    Cartier, S.
    Dinapoli, R.
    Franz, T.
    Froejdh, E.
    Greiffenberg, D.
    Lopez-Cuenca, C.
    Mezza, D.
    Mozzanica, A.
    Nolting, F.
    Ramilli, M.
    Redford, S.
    Ruat, M.
    Ruder, Ch.
    Schaedler, L.
    Schmidt, Th.
    Schmitt, B.
    Schuetz, F.
    Shi, X.
    Thattil, D.
    Vetter, S.
    Zhang, J.
    JOURNAL OF SYNCHROTRON RADIATION, 2017, 24 : 963 - 974
  • [30] A novel imaging energy filter for cathode lens electron microscopy
    Grzelakowski, Krzysztof
    ULTRAMICROSCOPY, 2012, 116 : 95 - 105
12345