TRANSMISSION ELECTRON-MICROSCOPY OF INTERFACES AND DEFECTS IN INTERGROWN PYROXENES

被引：0
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作者：
LIVI, KJT
VEBLEN, DR
机构：
来源：
AMERICAN MINERALOGIST | 1989年 / 74卷 / 9-10期
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中图分类号：
P3 [地球物理学]; P59 [地球化学];
学科分类号：
0708 ; 070902 ;
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页码：1070 / 1083
页数：14
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