TRANSMISSION ELECTRON-MICROSCOPY OF SURFACES AND INTERFACES

被引：0
|
作者：
BUFFAT, PA
CATANA, A
FLUELI, M
GANIERE, JD
ROSENFELD, D
STADELMANN, P
VERDON, C
机构：
来源：
ANALUSIS | 1993年 / 21卷 / 08期
关键词：
D O I：
暂无
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
Modern transmission electron microscopes offer imaging capabilities down to the atomic lattice resolution, as well as crystallographic and chemical microanalysis with 2-nanometer diameter probes in thin foils. These analytical microscopes are powerful tools for surface, interface and thin films studies.
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页码：M6 / &
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