CONTRIBUTION OF DIFFRACTION TO THE CONTRAST OF DISLOCATIONS IN X-RAY TOPOGRAPHY

被引：6
|
作者：
EPELBOIN, Y [1 ]
机构：
[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1979年 / 35卷 / JAN期
关键词：
D O I：
10.1107/S0567739479000073
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：38 / 44
页数：7
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