CONTRIBUTION OF DIFFRACTION TO THE CONTRAST OF DISLOCATIONS IN X-RAY TOPOGRAPHY

被引：6

作者：

EPELBOIN, Y ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1979年 / 35卷 / JAN期

关键词：

D O I：

10.1107/S0567739479000073

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：38 / 44

页数：7

共 50 条

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