ELECTRON DISPLACEMENT DAMAGE IN COPPER AND ALUMINIUM IN A HIGH VOLTAGE ELECTRON MICROSCOPE

被引：129
|
作者：
MAKIN, MJ
机构：
来源：
PHILOSOPHICAL MAGAZINE | 1968年 / 18卷 / 153期
关键词：
D O I：
10.1080/14786436808227466
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：637 / &
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