FOREIGN IMAGING IN AUGER-SPECTROSCOPY - THE SI 2P SPECTRUM OF SILICON TETRAFLUORIDE

被引：60
|
作者：
TARANTELLI, F [1 ]
CEDERBAUM, LS [1 ]
机构：
[1] UNIV HEIDELBERG,W-6900 HEIDELBERG,GERMANY
来源：
PHYSICAL REVIEW LETTERS | 1993年 / 71卷 / 04期
关键词：
D O I：
10.1103/PhysRevLett.71.649
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We performed Green's function calculations on the double ionization of SiF4 in order to interpret its Si 2p Auger spectrum, which has caused controversy for a decade. We provide an accurate interpretation and a model of far wider generality in the Auger study of ionic species. Contrary to the usual self-imaging picture of Auger spectroscopy, the silicon spectrum exhibits eight distinct bands reflecting a complete and precise image of the fluorine ligands, due to strong hole-localization effects. The generality of this foreign-imaging character of Auger spectroscopy is discussed.
引用
收藏
页码：649 / 652
页数：4
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