AN ANALYTICAL DESCRIPTION OF OBSERVED STRESS PATTERNS ON X-RAY TOPOGRAPHS OF SILICON

被引：1

作者：

WALFORD, LK

CARRON, GJ

机构：

来源：

关键词：

D O I：

10.1063/1.1656055

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5802 / &

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[1] ANOMALOUS BEAM OBSERVED IN X-RAY DIFFRACTION TOPOGRAPHS
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