RADIATION FAILURE MODES IN CMOS INTEGRATED-CIRCUITS

被引：13

作者：

BURGHARD, RA ^{[1
]}

GWYN, CW ^{[1
]}

机构：

[1] SANDIA LABS, ALBUQUERQUE, NM 87115 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1973年 / NS20卷 / 06期

关键词：

D O I：

10.1109/TNS.1973.4327411

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：300 / 306

页数：7

共 50 条

[1] RADIATION HARDENING OF CMOS-SOS INTEGRATED-CIRCUITS
SCHLESIER, KM
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1974, NS21 (06) : 152 - 158
[2] RELIABILITY OF CMOS INTEGRATED-CIRCUITS
SCHNABLE, GL
GALLACE, LJ
PUJOL, HL
[J]. COMPUTER, 1978, 11 (10) : 6 - 17
[3] DESIGN OPTIMIZATION OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
FOSSUM, JG
DERBENWICK, GF
GREGORY, BL
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, 22 (06) : 2208 - 2213
[4] RADIATION RESPONSE OF HIGH-SPEED CMOS INTEGRATED-CIRCUITS
YUE, H
DAVISON, D
JENNINGS, RF
LOTHONGKAM, P
RINERSON, D
WYLAND, D
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1987, 34 (06) : 1464 - 1466
[5] PROCESS OPTIMIZATION OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
DERBENWICK, GF
GREGORY, BL
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, 22 (06) : 2151 - 2156
[6] PROCESS TECHNOLOGY FOR RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
DAWES, WR
DERBENWICK, GF
GREGORY, BL
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1976, 11 (04) : 459 - 465
[7] CMOS INTEGRATED-CIRCUITS FOR MULTIVALUED LOGIC
MOUFTAH, HT
SMITH, KC
[J]. INTERNATIONAL JOURNAL OF ELECTRONICS, 1985, 58 (01) : 43 - 50
[8] RELIABILITY OF CMOS SOS INTEGRATED-CIRCUITS
VELORIC, H
DUGAN, MP
MORRIS, W
DENNING, R
SCHNABLE, G
[J]. RCA REVIEW, 1984, 45 (02): : 230 - 248
[9] NUCLEAR RADIATION EFFECTS ON INTEGRATED-CIRCUITS (TTL, MOS, CMOS, SOS)
CHARLOT, JM
[J]. ONDE ELECTRIQUE, 1983, 63 (02): : 43 - 48
[10] TECHNOLOGICAL ADVANCES IN MANUFACTURE OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
PIKOR, A
REISS, EM
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1977, 24 (06) : 2047 - 2050

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