RADIATION FAILURE MODES IN CMOS INTEGRATED-CIRCUITS

被引：13

作者：

BURGHARD, RA ^{[1
]}

GWYN, CW ^{[1
]}

机构：

[1] SANDIA LABS, ALBUQUERQUE, NM 87115 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1973年 / NS20卷 / 06期

关键词：

D O I：

10.1109/TNS.1973.4327411

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：300 / 306

页数：7

共 50 条

[31] BREAKTHROUGH IN INTERNAL FAILURE ANALYSIS OF INTEGRATED-CIRCUITS
FROSIEN, J
FAZEKAS, P
LANIO, S
SCHONECKER, G
WEBSTER, N
TOKUNAGA, Y
[J]. MICROELECTRONIC ENGINEERING, 1992, 16 (1-4) : 79 - 86
[32] FAILURE PHYSICS OF INTEGRATED-CIRCUITS AND RELATIONSHIP TO RELIABILITY
STOJADINOVIC, ND
RISTIC, SD
[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1983, 75 (01): : 11 - 48
[33] INTEGRATED-CIRCUITS
BURSKY, D
[J]. ELECTRONIC DESIGN, 1983, 31 (20) : 172 - &
[34] USERS GUIDEBOOK TO DIGITAL CMOS INTEGRATED-CIRCUITS - HNATEK,ER
SHIVA, SG
[J]. PROCEEDINGS OF THE IEEE, 1983, 71 (05) : 686 - 687
[35] CMOS ANALOG INTEGRATED-CIRCUITS BASED ON WEAK INVERSION OPERATION
VITTOZ, E
FELLRATH, J
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1977, 12 (03) : 224 - 231
[36] ELECTRICALLY ACTIVE STACKING-FAULTS IN CMOS INTEGRATED-CIRCUITS
DISHMAN, JM
HASZKO, SE
MARCUS, RB
MURARKA, SP
SHENG, TT
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1976, 123 (11) : C370 - C370
[37] INFLUENCE OF DESIGN AND PROCESS PARAMETERS ON RELIABILITY OF CMOS INTEGRATED-CIRCUITS
AITKEN, A
KUNG, P
[J]. MICROELECTRONICS AND RELIABILITY, 1978, 17 (01): : 201 - 210
[38] FAULT MODELING AND LOGIC SIMULATION OF CMOS AND MOS INTEGRATED-CIRCUITS
WADSACK, RL
[J]. BELL SYSTEM TECHNICAL JOURNAL, 1978, 57 (05): : 1449 - 1474
[39] SELECTIVE EPITAXIAL-GROWTH FOR THE FABRICATION OF CMOS INTEGRATED-CIRCUITS
IPRI, AC
JASTRZEBSKI, L
CORBOY, JF
METZL, R
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (12) : 1741 - 1748
[40] PRECISION DIGITAL INSTANTANEOUS CARDIOTACHOMETER USING CMOS INTEGRATED-CIRCUITS
TAYLOR, KD
PARADISE, ED
[J]. MEDICAL & BIOLOGICAL ENGINEERING & COMPUTING, 1979, 17 (06) : 786 - 788

← 1 2 3 4 5 →