DESIGN OPTIMIZATION OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS

被引：24

作者：

FOSSUM, JG ^{[1
]}

DERBENWICK, GF ^{[1
]}

GREGORY, BL ^{[1
]}

机构：

[1] SANDIA LABS,ALBUQUERQUE,NM 87115

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1975年 / 22卷 / 06期

关键词：

D O I：

10.1109/TNS.1975.4328107

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2208 / 2213

页数：6

共 50 条

[1] PROCESS OPTIMIZATION OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
DERBENWICK, GF
GREGORY, BL
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1975, 22 (06) : 2151 - 2156
[2] PROCESS TECHNOLOGY FOR RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
DAWES, WR
DERBENWICK, GF
GREGORY, BL
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1976, 11 (04) : 459 - 465
[3] TECHNOLOGICAL ADVANCES IN MANUFACTURE OF RADIATION-HARDENED CMOS INTEGRATED-CIRCUITS
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REISS, EM
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1977, 24 (06) : 2047 - 2050
[4] RADIATION-HARDENED CMOS-SOS LSI CIRCUITS
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[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1976, 23 (06) : 1613 - 1616
[5] PRESENT STATUS OF RESEARCH ON RADIATION HARDENED INTEGRATED-CIRCUITS
ONO, M
[J]. APPLIED RADIATION AND ISOTOPES, 1986, 37 (01) : 96 - 97
[6] RADIATION EFFECTS IN SEMICONDUCTORS - TECHNOLOGIES FOR HARDENED INTEGRATED-CIRCUITS
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[J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1984, (69): : 83 - 103
[7] EXPORT OF RADIATION HARDENED INTEGRATED-CIRCUITS FOR COMMERCIAL SATELLITES
ROTHMAN, HE
CHURCHILL, DA
[J]. GEORGE WASHINGTON JOURNAL OF INTERNATIONAL LAW AND ECONOMICS, 1987, 21 (02): : 235 - 250
[8] RADIATION FAILURE MODES IN CMOS INTEGRATED-CIRCUITS
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[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1973, NS20 (06) : 300 - 306
[9] RADIATION-HARDENED JFET DEVICES AND CMOS CIRCUITS FABRICATED IN SOI FILMS
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[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) : 1372 - 1376
[10] DEVELOPMENT OF MOS-TRANSISTORS FOR RADIATION-HARDENED LARGE-SCALE INTEGRATED-CIRCUITS AND ANALYSIS OF RADIATION-INDUCED DEGRADATION
KAMIMURA, H
YOSHIOKA, S
AKIYAMA, M
NAKAMURA, M
TAMURA, T
KUBOYAMA, S
[J]. JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 1994, 31 (01) : 24 - 33

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