The excitation, reflection, and utilization in crystal-structure analyses of characteristic secondary X-rays

被引：0
|
作者：
Clark, GL [1 ]
机构：
[1] Harvard Imov, Jefferson Phys Lab, Cambridge, MA USA
来源：
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 1924年 / 46卷
关键词：
D O I：
10.1021/ja01667a012
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
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页码：372 / 384
页数：13
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